Thursday, 8 September 2005 - 2:00 PM

This presentation is part of: New Innovations and Revolutionary Concepts

Trace Element AMS at NRL: Initial Use of a Modified SIMS Ion Source

Kenneth S. Grabowski1, David L. Knies1, and Catalina Cetina2. (1) Naval Research Laboratory, 4555 Overlook Ave SW, Washington, DC 20375-5343, (2) Nova Research, Inc., 1900 Elkin St, Suite 230, Alexandria, VA 22308

There has been recent interest to attach a high-energy ion accelerator to the output of a secondary ion mass spectrometer (SIMS). NRL has undertaken such an effort, to improve the rejection of molecular ions and thus lower the limit of detection for masses above 90 Daltons. In this mass range molecules containing H, C, N, O, and other light species that are present can create molecular interferences with M/DM values greater than 10,000. These create a background difficult to remove in conventional SIMS analysis. Using a tandem accelerator and a gas stripper cell, molecules can be broken apart, leaving only atomic ions to measure. By measuring the energy of collected ions, residual interferences caused by molecular fragments in altered charge states can be rejected. The NRL AMS facility provides a further enhancement, in that this system is designed to transmit ions in parallel over a broad mass range. This enables higher precision measurements, for example of isotope ratios, but also allows efficient and sensitive data collection over a relatively broad mass spectrum. This is important, for example, for Genesis Return Mission samples that have trapped solar wind atoms in the surface of collector plates of various materials. This presentation describes initial results obtained using common calibration and tuning samples, to demonstrate the capabilities of the new configuration of the NRL AMS system.

This work is supported by the United States Office of Naval Research and a grant from NASA.


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