In combination with our novel compact radiocarbon dating system we have developed a new sputter ion source. Its concept is based on conventional high current ion sources with spherical ionizers as they are routinely applied for AMS measurements. However, we incorporated several new features, which are not commonly used. First of all we have designed the vacuum box of the ion source in a way that it enables operation keeping the source box on ground potential. All necessary high voltages to generate ion beams are feed from below via HV vacuum feedthroughs. A high voltage platform is integrated in the support frame of the source hosting several HV power supplies. Thus, no open high voltages are present during source operation and all visible components can be accessed any time during a measurement. This concept requires a special setup for the sample changer which is also kept on ground potential. A linear magazine with 21 different samples can be exchanged through a vacuum lock while the source is in operation. Loading cycles are short which makes possible a quasi-continuous measurement of sample series. In a later stage an automated magazine exchange system with two load locks is planned to handle properly large number sample series with short measuring time required. In addition, the source is equipped with a gas feed system. To switch from solid target material to gas samples only the cathode place in the target position has to be exchanged and the gas handling system has to be started.
See more of Ion Sourcery (optics, modeling, performance, etc)
See more of The 10th International Conference on Accelerator Mass Spectrometry (September 5-10, 2005)